Name | Scanning Electron Microscopy (SEM) |
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Function | Alat ini berfungsi untuk melihat morfologi permukaan material |
Contact Name | Budi Setiawan |
Contact Number | 021-727-0028 |
Address | Depok |
Specification : | |
Magnification: Secondary electron image:10 to 60,000x Backscattered electron image:10 to 30,000x Observation Modes: High vacuum and low vacuum modes Electron Gun: Small grid gun integrating filament and wehnelt Accelerating Voltages: Secondary electron image: 3 stages 15 kV/10 kV/5 kV Backscattered electron image: 2 stages 15 kV/10 kV Specimen Stage: Manual control for X and Y X: 35mm, Y: 35mm Maximum Specimen Size: Diameter 70 mm, height 50 mm Signal Detection: High vacuum (secondary electron image, backscattered electron image) Low vacuum (backscattered electron image) File Format: BMP, TIFF, JPEG Operating System: Windows 7 Automatic Functions: Auto focus, auto stigmator Auto contrast/brightness control Auto gun alignment Composition: Base unit, power supply box, PC, LCD, rotary pump Dimensions (WxDxH; Main Unit): 330 (W) x 490 (D) x 430 (H) mm Power: Single phase AC 100 V (700 VA), 120 V (840 VA), 220 V (880 VA). 240 V (960 VA) Fluctuation ±10%, grounded Room Temperature: 15°C to 30°C Humidity: 60% or less | |
Procedure : | |
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