Detail Information

Name Scanning Electron Microscopy (SEM)
Function Alat ini berfungsi untuk melihat morfologi permukaan material
Contact Name Budi Setiawan
Contact Number 021-727-0028
Address Depok
Specification :
Magnification: Secondary electron image:10 to 60,000x
Backscattered electron image:10 to 30,000x
Observation Modes: High vacuum and low vacuum modes
Electron Gun: Small grid gun integrating filament and wehnelt
Accelerating Voltages: Secondary electron image: 3 stages 15 kV/10 kV/5 kV
Backscattered electron image: 2 stages 15 kV/10 kV
Specimen Stage: Manual control for X and Y
X: 35mm, Y: 35mm
Maximum Specimen Size: Diameter 70 mm, height 50 mm
Signal Detection: High vacuum (secondary electron image, backscattered electron image)
Low vacuum (backscattered electron image)
File Format: BMP, TIFF, JPEG
Operating System: Windows 7
Automatic Functions: Auto focus, auto stigmator
Auto contrast/brightness control
Auto gun alignment
Composition: Base unit, power supply box, PC, LCD, rotary pump
Dimensions (WxDxH; Main Unit): 330 (W) x 490 (D) x 430 (H) mm
Power: Single phase AC 100 V (700 VA), 120 V (840 VA), 220 V (880 VA). 240 V (960 VA)
Fluctuation ±10%, grounded
Room Temperature: 15°C to 30°C
Humidity: 60% or less
Procedure :
  1. Mendaftar secara online melalui
  2. Memba


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